DAC5689 Datasheet, PDF(12/48 Page) Texas Instruments – 16-BIT 800 MSPS 2x-8x INTERPOLATING DUAL-CHANNEL DIGITAL-TO-ANALOG CONVERTER (DAC)

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DAC5689

SLLS989 â SEPTEMBER 2009 .......................................................................................................................................................................................... www.ti.com

TEST METHODOLOGY

Typical AC specifications were characterized with the DAC5689EVM. A sinusoidal master clock frequency is

generated by an HP8665B signal generator which drives an Agilent 8133A pulse generator to generate a square

wave output clock for the TSW3100 Pattern Generator and EVM input clock. On the EVM, the input clock is

driven by an CDCM7005 clock distribution chip that is configured to simply buffer the external clock or divide it

down for necessary test configurations.

The DAC5689 output is characterized with a Rohde and Schwarz FSU spectrum analyzer. For WCDMA signal

characterization, it is important to use a spectrum analyzer with high IP3 and noise subtraction capability so that

the spectrum analyzer does not limit the ACPR measurement.

DEFINITION OF SPECIFICATIONS

Adjacent Carrier Leakage Ratio (ACLR): Defined for a 3.84Mcps 3GPP W-CDMA input signal measured in a

3.84MHz bandwidth at a 5MHz offset from the carrier with a 12dB peak-to-average ratio.

Analog and Digital Power Supply Rejection Ratio (APSRR, DPSRR): Defined as the percentage error in the

ratio of the delta IOUT and delta supply voltage normalized with respect to the ideal IOUT current.

Differential Nonlinearity (DNL): Defined as the variation in analog output associated with an ideal 1 LSB

change in the digital input code.

Gain Drift: Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per Â°C, from the

value at ambient (25Â°C) to values over the full operating temperature range.

Gain Error: Defined as the percentage error (in FSR%) for the ratio between the measured full-scale output

current and the ideal full-scale output current.

Integral Nonlinearity (INL): Defined as the maximum deviation of the actual analog output from the ideal output,

determined by a straight line drawn from zero scale to full scale.

Intermodulation Distortion (IMD3, IMD): The two-tone IMD3 or four-tone IMD is defined as the ratio (in dBc) of

the worst 3rd-order (or higher) intermodulation distortion product to either fundamental output tone.

Offset Drift: Defined as the maximum change in DC offset, in terms of ppm of full-scale range (FSR) per Â°C,

from the value at ambient (25Â°C) to values over the full operating temperature range.

Offset Error: Defined as the percentage error (in FSR%) for the ratio of the differential output current

(IOUT1âIOUT2) and the mid-scale output current.

Output Compliance Range: Defined as the minimum and maximum allowable voltage at the output of the

current-output DAC. Exceeding this limit may result reduced reliability of the device or adversely affecting

distortion performance.

Reference Voltage Drift: Defined as the maximum change of the reference voltage in ppm per degree Celsius

from value at ambient (25Â°C) to values over the full operating temperature range.

Spurious Free Dynamic Range (SFDR): Defined as the difference (in dBc) between the peak amplitude of the

output signal and the peak spurious signal.

Signal to Noise Ratio (SNR): Defined as the ratio of the RMS value of the fundamental output signal to the

RMS sum of all other spectral components below the Nyquist frequency, including noise, but excluding the first

six harmonics and dc.

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