TIBPAL20L8-10C Datasheet, PDF (10/24 Pages) Texas Instruments – HIGH-PERFORMANCE IMPACT-X PAL CIRCUITS

TIBPAL20L8-10C, TIBPAL20R4-10C, TIBPAL20R6-10C, TIBPAL20R8-10C
HIGH-PERFORMANCE IMPACT-X ™ PAL^® CIRCUITS
SRPS008A – D3336, OCTOBER 1989 – REVISED MARCH 1992
electrical characteristics over recommended operating free-air temperature range
PARAMETER
VIK
VOH
VOL
IOZH‡
O, Q outputs
I/O ports
IOZL‡
O, Q outputs
I/O ports
II
IIH‡
IIL‡
IOS§
ICC
Ci
Co
Cclk
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
Outputs open,
f = 1 MHz,
f = 1 MHz,
f = 1 MHz,
TEST CONDITIONS
II = – 18 mA
IOH = – 3.2 mA
IOL = 24 mA
VO = 2.7 V
VO = 0.4 V
VI = 5.5 V
VI = 2.7 V
VI = 0.4 V
VO = 0.5 V
VI = 0,
OE = VIH
VI = 2 V
VO = 2 V
VCLK = 2 V
MIN TYP†
–0.8
2.4
0.3
MAX
– 1.5
0.5
20
100
– 20
– 100
0.2
25
– 0.25
– 30 –70 – 130
210
7
8
12
UNIT
V
V
V
µA
µA
mA
µA
mA
mA
mA
pF
pF
pF
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST CONDITION
MIN TYP† MAX UNIT
without feedback
71.4
fmax¶
with internal feedback
(counter configuration)
58.8
MHz
with external feedback
55.5
tpd
I, I/O
tpd
CLK↑
O, I/O
Q
R1 = 200 Ω,
R2 = 390 Ω,
3
8
10
2
5
8 ns
tpd#
CLK↑
Feedback input
See Figure 6
7 ns
ten
tdis
ten
tdis
tsk(o)||
OE↓
OE↑
I, I/O
I, I/O
Q
Q
O, I/O
O, I/O
Skew between registered outputs
2
6
2
6
3
8
2
8
0.5
10 ns
10 ns
10 ns
10 ns
ns
† _{All typical values are at VCC = 5 V, TA = 25°C.}
‡ _{I/O leakage is the worst case of IOZL and IIL or IOZH and IIH respectively.}
§ _{Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to}
avoid test problems caused by test equipment ground degradation.
¶ _{See section for fmax specifications. fmax does not apply for TIBPAL20L8’.}
# _{This parameter applies to TIBPAL20R4’ and TIBPAL20R6’ only (see Figure 4 for illustration) and is calculated from the measured fmax with internal}
feedback in the counter configuration.
|| _{This parameter is the measurement of the difference between the fastest and slowest tpd (CLK-to-Q) observed when multiple registered outputs}
are switching in the same direction.
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