TIBPAL20L8-10C Datasheet, PDF (1/24 Pages) Texas Instruments – HIGH-PERFORMANCE IMPACT-X PAL CIRCUITS

TIBPAL20L8-10C, TIBPAL20R4-10C, TIBPAL20R6-10C, TIBPAL20R8-10C
HIGH-PERFORMANCE IMPACT-X ™ PAL^® CIRCUITS
• High-Performance Operation:
f_max (no feedback)
TIBPAL20R’ . . . 71.4 MHz
f_max (internal feedback)
TIBPAL20R’ . . . 58.8 MHz
f_max (external feedback)
TIBPAL20R’ . . . 55.5 MHz
Propagation Delay
TIBPAL20’ . . . 10 ns Max
• Functionally Equivalent, but Faster Than
Existing 24-Pin PLD Circuits
• Preload Capability on Output Registers
Simplifies Testing
• Power-Up Clear on Registered Devices (All
Register Outputs are Set Low, but Voltage
Levels at the Output Pins Go High)
• Package Options Include Plastic Chip
Carriers in Addition to Plastic and Ceramic
DIPs
• Security Fuse Prevents Duplication
• Dependable Texas Instruments Quality and
Reliability
DEVICE
I
3-STATE
INPUTS O OUTPUTS
PAL20L8
14
2
PAL20R4
12
0
PAL20R6
12
0
PAL20R8
12
0
REGISTERED
Q OUTPUTS
0
4 (3-state buffers)
6 (3-state buffers)
8 (3-state buffers)
I/O
PORT
S
6
4
2
0
SRPS008A – D3336, OCTOBER 1989 – REVISED MARCH 1992
TIBPAL20L8’
JT OR NT PACKAGE
(TOP VIEW)
I₁
I₂
I₃
I₄
I₅
I₆
I7
I8
I9
I 10
I 11
GND 12
24 ^V_CC
23 ^I
22 ^O
21 ^I/O
20 ^I/O
19 ^I/O
18 I/O
17 I/O
16 I/O
15 O
14 I
13 I
TIBPAL20L8’
FN PACKAGE
(TOP VIEW)
4 3 2 1 28 27 26
I⁵
25 I/O
I⁶
24 I/O
I⁷
23 I/O
NC ⁸
22 NC
I⁹
21 I/O
I ¹⁰
20 I/O
I ¹¹
19 I/O
12 13 14 15 16 17 18
description
These programmable array logic devices feature
high speed and functional equivalency when
NC – No internal connection
Pin assignments in operating mode
compared with currently available devices. These
IMPACT-X™ circuits combine the latest Advanced
Low-Power Schottky technology with proven titanium-tungsten fuses to provide reliable, high-performance
substitutes for conventional TTL logic. Their easy programmability allows for quick design of custom functions
and typically results in a more compact circuit board. In addition, chip carriers are available for futher reduction
in board space.
All of the register outputs are set to a low level during power up. Extra circuitry has been provided to allow loading
of each register asynchronously to either a high or low state. This feature simplifies testing because the registers
can be set to an initial state prior to executing the test sequence.
The TIBPAL20’ C series is characterized from 0°C to 75°C.
These devices are covered by U.S. Patent 4,410,987.
IMPACT-X is a trademark of Texas Instruments Incorporated.
PAL is a registered trademark of Advanced Micro Devices Inc.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily
include testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1992, Texas Instruments Incorporated
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