TC341 Datasheet, PDF (10/17 Pages) Texas Instruments – 780X488 PIXEL CCD IMAGE SENSOR

TC341
780×488 PIXEL
CCD IMAGE SENSOR
SOCS083A – OCTOBER 2002
optical characteristics, T_A = 40°C (unless otherwise noted)
MIN TYP MAX UNIT
Sensitivity (Note 7)
No IR filter
413
mV/Lx
With IR filter
51
VOFF
Zero input offset (Note 8)
Blooming overload ratio (Note 9)
0
100
500:1
200 mV
Image area well capacity with antiblooming off
70k
80k
00k
Image area well capacity with antiblooming on
35k
40k
45k
Smear (Note 10)
–75 dB
Dark current (Note 11)
TA = 21°C
0.1 nA/cm2
Dark signal (Note 12)
TA = 21°C
0.06
mV
Dark-signal uniformity (Note 13)
TA = 21°C
0.03
mV
Dark-signal shading (Note 14)
TA = 21°C
0.03
mV
Spurious nonuniformity
Dark (Note 15)
TA = 21°C
3.5
mV
Illuminated lens F#8 TA = 21°C
15
%
Column uniformity (Note 16)
TA = 21°C
0.3
mV
Electronic-shutter capability
1/1000 1/30
sec
NOTES: 7. Light source temperature is 2856°K. The IR filter used is CM500 1mm thick. Integration time is 1/30 sec.
8. This is a signal pedestal measured from the output level after reset to the output level after the SRG negative transition without any
light input into the sensor.
9. Blooming is the condition in which charge induced by light in one element spills over to the neighboring elements.
10. Smear is the measure of error signal introduced into the pixels by transferring them through the illuminated region into the memory.
The illuminated region is 1/10 of the image area height. The value in the table is obtained for the integration time of 33.33 ms and
8 MHz vertical clock transfer frequency.
11. Dark current depends on temperature and approximately doubles every 8°C.
12. Dark signal is actual device output measured in dark.
13. Dark signal uniformity is the sigma of difference of two neighboring pixels taken from all the image area pixels.
14. Dark signal shading is the difference between maximum and minimum of 5 pixel median taken anywhere in the array.
15. Spurious non-uniformity is the signal of no more than three neighboring pixels that exceeds or is less than average.
16. Column uniformity is obtain by summing all the lines in the array, finding the maximum of the difference of two neighboring columns
anywhere in the array, and dividing the result by number of lines.
pixel defect specifications, integration time = 1/60 sec, temperature = 40°C
DEVICE PART
NUMBER
DEVICE IN DARK
DEFECT COUNT
NUMBER
WS
BS
WS/BS
AREA
AB
AREA
AB
AREA
AB
DEVICE ILLUMINATED
DEFECT
COUNT
NUMBER
WS
SIGNAL OUTPUT
LEVEL
AREA
AB
TOTAL
DEFECT
COUNT
TC341-20
> 3.5 mV
0000 0
0 > 5%
0 0 50 mV
0
+/– 10 mV
TC341-30
2.5~3.5 mV
2525 2
2 5~7.5%
25
12
> 3.5 mV
0000 0
0 > 7.5%
00
TC341-40
3.5~7 mV
3737 3
7 7.5~15%
37
15
> 7 mV
0000 0
17. See Figure 3 for definitions of area A and area B.
0 > 15%
00
10
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