TC341 Datasheet, PDF (1/17 Pages) Texas Instruments – 780X488 PIXEL CCD IMAGE SENSOR

D High-Resolution, Solid State Image Sensor
for B/W Video and Computer Applications
D 11-mm Image-Area Diagonal Compatible
with 2/3” Vidicon Optics
D 754(H)×484(V) Active Elements in
Image-Sensing Area
D Lateral Overflow Drain Antiblooming
D Electronic Exposure Control
D Interlace or Progressive Scan Readout
D Line Summing and Pixel Summing Modes
D Low Dark Current
D Dynamic Range Larger than 64 dB
D High Sensitivity
D High Blue Response Including DUV
D Single Phase Clocking
D Solid State Reliability With No Image
Burn-In, Residual Imaging, Image
Distortion, Image Lag, or Microphonics
GND 1
ODB 2
IAG 3
GND 4
SAG 5
SAG 6
GND 7
VOUT 8
VDD 9
CDB 10
NC 11
TC341
780×488 PIXEL
CCD IMAGE SENSOR
SOCS083A – OCTOBER 2002
DUAL-IN-LINE PACKAGE
(TOP VIEW)
22 GND
21 IDB
20 IAG
19 GND
18 GND
17 GND
16 NC
15 SRG
14 TRG
13 RSG
12 NC
description
The Texas Instruments TC341 sensor is a high-performance frame-transfer charge-coupled device (CCD)
image sensor. It is designed for use in B/W video and computer camera applications. The device is intended
to replace the 2/3-inch vidicon tube in applications requiring small size, high reliability, and lower cost.
The image-sensing area of the TC341 sensor is configured into 488 lines with 780 elements in each line.
Twenty-six elements are provided in each line for a dark reference. The blooming protection of the sensor is
based on an advanced lateral overflow drain (ALOD). The antiblooming function is activated when a suitable
dc bias is applied to the antiblooming drain pin. With this type of blooming protection it is also possible to clear
the image area of all charge. This is accomplished by supplying a single 10 V pulse for a minimum of 1 µs to
the overflow drain pin.
The sensor is designed to operate in interlace as well in progressive scan modes. The interlace mode of
operation can be achieved in two ways: by skipping odd or even lines in corresponding image fields or by a
suitable line summing. The line summing provides higher sensitivity, because all collected charge is used. The
line skipping provides somewhat higher vertical resolution, but with a penalty of lower sensitivity. The
progressive scan mode sacrifices neither sensitivity nor resolution.
A standard gated floating-diffusion charge detection node structure converts charge into a signal voltage. For
higher accuracy and stability, this structure is reset to an on-chip automatic potential-tracking voltage reference.
The reset gate has a separate external pin, which allows implementing pixel summing by skipping the detection
node reset pulses. A low-noise, two-stage, source-follower amplifier buffers the output and provides high
output-driving capability. The TC341 sensor is built using TI-proprietary virtual-phase technology, which
provides devices with high blue response, low dark current, high photoresponse uniformity, and a single-phase
clocking.
The TC241 sensor is characterized for operation from –10°C to 45°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2002, Texas Instruments Incorporated
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