TLC59731 Datasheet, PDF (1/24 Pages) Texas Instruments – 3-Channel, 8-Bit, PWM LED Driver with Single-Wire Interface (EasySet)

TLC59731
www.ti.com
SBVS222 – FEBRUARY 2013
3-Channel, 8-Bit, PWM LED Driver
with Single-Wire Interface (EasySet)
Check for Samples: TLC59731
FEATURES
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•2 Three Sink Current Channels
• Current Capability:
– 50 mA per Channel
• Grayscale (GS) Control with PWM:
– 8-Bit (256 Steps) with Simple Gamma
Correction
• Single-Wire Interface (EasySet)
• Power-Supply (VCC) Voltage Range:
– No Internal Shunt Regulator Mode:
3 V to 5.5 V
– Internal Shunt Regulator Mode: 3 V to 6 V
• OUT Terminals Maximum Voltage: Up to 21 V
• Integrated Shunt Regulator
• Data Transfer Maximum Rate:
– Bits per Second (bps): 1 Mbps
• Internal GS Clock Oscillator: 6 MHz (typ)
• Display Repeat Rate: 3.1 kHz (typ)
• Output Delay Switching to Prevent Inrush
Current
• Unlimited Device Cascading
• Operating Temperature: –40°C to +85°C
APPLICATIONS
• RGB LED Cluster Lamp Display
DESCRIPTION
The TLC59731 is an easy-to-use, 3-channel, 50-mA
sink current LED driver. The single-wire, 1-Mbps
serial interface (EasySet) provides a solution for
minimizing wiring cost. The LED driver provides 8-bit
pulse width modulation (PWM) resolution and a
simple gamma correction feature. The display repeat
rate is achieved at 3.1 kHz (typ) with an integrated 6-
MHz grayscale (GS) clock oscillator. The driver also
provides unlimited cascading capability.
Output sink current can be set by each external
resistor connected to the OUTn terminal in series.
The TLC59731 has an internal shunt regulator that
can be used for higher VCC power-supply voltage
applications.
Power
Supply
(5 V)
VCC
GND
Controller
OPEN
or GND
GND
TEST
Device
SDI
VCC
OUT0
OUT1
OUT2
SDO
OPEN
or GND
GND
TEST
Device
SDI
VCC
OUT0
OUT1
OUT2
SDO
Figure 1. Typical Application Circuit Example 1 (No Internal Shunt Regulator Mode)
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated