RHRG30120 Datasheet, PDF (3/3 Pages) Fairchild Semiconductor – 30A, 1200V Hyperfast Diode

RHRG30120
®
IF
trr
dIF/dt
Qrr
IRRM
0.9 IRRM
0.25 IRRM
Fig7. Diode Reverse Recovery Test Circuit and Waveform
D
Ejector pin hole thickness (h)
A
c1
Ø
A1
b1
SYMBOL
A
A1
b
b1
c
c1
D
E1
E2
L
L1
L2
Ø
e
H
h
b
e
c
DIMENSIONS IN MILLIMETERS
MIN.
MAX.
4.850
5.150
2.200
2.600
1.000
1.400
1.800
2.200
0.500
0.700
1.900
2.100
15.450
15.750
3.500 Ref.
3.600 Ref.
40.900
41.300
24.800
25.100
20.300
20.600
7.100
7.300
10.900 Typ.
5.980 Typ.
0.000
0.300
TO-247-2L DIMENSIONS
DIMENSIONS IN INCHES
MIN.
MAX.
0.191
0.200
0.087
0.102
0.039
0.055
0.071
0.087
0.020
0.028
0.075
0.083
0.608
0.620
0.138 Ref.
0.142 Ref.
1.610
1.626
0.976
0.988
0.799
0.811
0.280
0.287
0.429 Typ.
0.235 Typ.
0.000
0.012
Rev.05
© 2006 Thinki Semiconductor Co.,Ltd.
Page 3/3
http://www.thinkisemi.com/