U3750BM Datasheet, PDF (7/20 Pages) TEMIC Semiconductors – One Chip Telephone Circuit

TELEFUNKEN Semiconductors
U3750BM
Parameters
Test Conditions / Pins Symbol Min.
Typ.
Max.
Unit
DTMF generation Pin 4 grounded
Tone frequency accuracy V_RAM = 3.5 V
(confidence tone included)
–0.4
+0.25
%
Low group tone level
(depends on external
components)
W ^{(Note 2)}
Measured on 600
I_L = 28 mA
figure 3
–10
–8
–6
dBm
High group tone level
(depends on external
components)
W ^{(Note 2)}
Measured on 600
I_L = 28 mA
figure 3
–8
–6
–4
dBm
Preemphasis (depends on
external components)
(Note 2)
W Measured on 600
I_L = 28 mA
figure 3
1
2
3
dB
DTMF distortion (depends
on external components)
(Note 2 and note 3)
W Measured on 600
I_L = 28 mA,
300 < f < 3400 Hz
figure 3
3.5
%
DTMF transmission time
DTMF interdigit time
Transmission mute tm_MF
Confidence tone
Only by serial bus
t_MF
80.2
t_IMF
89.2
169.4
82.4
ms
89.2
ms
171.6
ms
FCT frequency
Tone level (depends on
external components)
W Measured on 600
I_L = 25 mA
figure 3
440.9
Hz
–9
dBm
Note 1: sending gain: G_S = V_L/V_MI with the values of
R_AG1 and R_AG2 (figure 3) so the maximum gain
is at 28 mA and the minimum gain is at 60 mA.
Note 2: For DTMF measurements, close switches S1 and
S3 and select each group of frequencies on the
keyboard.
Note 3: The level of each harmonic on line is under the
limited curve given below with the filter compo-
nents value chosen for the test.
Rev. A1: 16.07.1996
Figure 1
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