108-2086 Datasheet, PDF (2/6 Pages) TE Connectivity Ltd – When tests are performed on the subject product line, procedures specified in Figure 1 shall be used.

108-2086
3.5. Test Requirements and Procedures Summary
Test Description
Initial examination of product.
Final examination of product.
Low level contact resistance.
Temperature rise vs current.
Current cycling.
Vibration, random.
Mechanical shock.
Requirement
Procedure
Meets requirements of product
drawing.
EIA-364-18.
Visual and dimensional (C of C)
inspection per product drawing.
Meets visual requirements.
EIA-364-18.
Visual inspection.
ELECTRICAL
2.5 milliohms maximum.
∆R 2.0 milliohms maximum.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
See Figure 3.
30°C maximum temperatu re rise at
specified current.
EIA-364-70,
Method 1.
Stabilize at a single current level
until 3 readings at 5 minute
intervals are within 1°C.
See Figure 4.
Temperature rise of the conductor
during the 500^th cycle shall not be
more than 15°C higher than the
temperature rise during the 24^th
cycle, and neither rise shall be
more than 85°C.
EIA-364-55.
Subject specimens to 500 cycles of
45 minutes current ON and 15
minutes current OFF.
See Figure 4.
MECHANICAL
No discontinuities of 1 microsecond EIA-364-28,
or longer duration.
Test Condition VII,
See Note.
Condition D.
Subject mated specimens to 3.10
G's rms between 20-500 Hz. 15
minutes in each of 3 mutually
perpendicular planes.
See Figure 5.
No discontinuities of 1 microsecond EIA-364-27,
or longer duration.
Method H.
See Note.
Subject mated specimens to 30 G's
half-sine shock pulses of 11
milliseconds duration. 3 shocks in
each direction applied along 3
mutually perpendicular planes, 18
total shocks.
See Figure 5.
Figure 1 (continuted)
Rev F
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