STM32L151RDT6 Datasheet, PDF (96/140 Pages) STMicroelectronics – Ultra-low-power 32-bit MCU ARM-based Cortex-M3, 384KB Flash, 48KB SRAM, 12KB EEPROM, LCD, USB, ADC, DAC, memory I/F

Electrical characteristics
STM32L151xD STM32L152xD
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
● A supply overvoltage is applied to each power supply pin
● A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 48. Electrical sensitivities
Symbol
Parameter
Conditions
LU
Static latch-up class T_A = +105 °C conforming to JESD78A
Class
II level A
6.3.12
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V_SS or
above V_DD (for standard pins) should be avoided during normal product operation. However,
in order to give an indication of the robustness of the microcontroller in cases when
abnormal injection accidentally happens, susceptibility tests are performed on a sample
basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error, out of spec current
injection on adjacent pins or other functional failure (for example reset, oscillator frequency
deviation, LCD levels, etc.).
The test results are given in the following table.
Table 49. I/O current injection susceptibility
Symbol
Description
Functional susceptibility
Negative
Positive
Unit
injection
injection
Injected current on true open-drain pins
-5
+0
I_INJ
Injected current on all 5 V tolerant (FT) pins
-5
Injected current on any other pin
-5
+0
mA
+5
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Doc ID 022027 Rev 6