RHFLVDS2281 Datasheet, PDF (9/17 Pages) STMicroelectronics – Rad-hard, dual 4x4 crosspoint switch LVDS

RHFLVDS2281
Electrical characteristics
Table 7. Electrical characteristics table (continued)
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
DV_OS
Change of magnitude of V_OS for
complementary output states
25 mV
I_OS Output short-circuit current
V_ID = -400 mV and V_OUT- = 0 V
V_ID = +400 mV and V_OUT+ = 0 V
-9
mA
I_OZ High impedance output current Disabled, V_OUT = 3.6 V or 0V
-10
I_OFFOUT
LVDS outputs power-off leakage
current
V_CC = 0 V, V_OUT = 3.6 V
-50
10
µA
+50
T_S Input to SL setup time⁽³⁾
T_H Input to SL Hold time⁽³⁾
T_Sw SL to Switched output⁽³⁾
Refer to Figure 5
1.6
1.5
5
t_PHLD
Propagation delay time, high to
low
V_ID = 200 mVp-p, input pulse from
1.5
4
t_PLHD
Propagation delay time, low to
high
1.1 V to 1.3 V, V_CM=1.2 V
Load: refer to Figure 3
1.5
4
t_SK1
t_SK2
t_SKD
Channel to channel skew⁽³⁾⁽⁴⁾
Chip to chip skew⁽³⁾⁽⁵⁾
Differential skew⁽⁶⁾
(t_PHLD-t_PLHD)
V_ID = 200 mVp-p
Load: refer to Figure 6
0.6
0.7
0.6
ns
t _r Output signal rise time
Refer to Figure 4
0.9
t_f
Output signal fall time
0.9
t_PLZ
Propagation delay time, low
level to high impedance output
2.8
t_PHZ
Propagation delay time, high
level to high impedance output
2.8
Refer to Figure 6
t_PZH
Propagation delay time, high
impedance to high level output
2.5
t_PZL
Propagation delay time, high
impedance to low level output
2.5
Fail-safe and cold-spare
t_D1 Fail-safe to active time
t_D2 Active to fail-safe time
1
µs
1
1. Guaranteed by characterization on bench.
2. All pins are floating except pin under test and V_CC.
3. Guaranteed by design.
4. t_SK1 is the maximum delay time difference between drivers on the same device (with all inputs connected together).
5. ta_{StKt2heisstahme emtaexmimpuemratduerela.y} time difference between outputs of all devices when they operate with the same supply voltage,
6. t_SKD is the maximum delay time difference between t_PHLD and t_PLHD (see Figure 4).
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