STD9HN65M2 Datasheet, PDF (8/16 Pages) STMicroelectronics – 100% avalanche tested

Test circuits
STD9HN65M2
3
Test circuits
Figure 14: Switching times test circuit for resistive
load
Figure 15: Gate charge test circuit
VDD
12 V
47 k Ω
100 nF
1 kΩ
Vi ≤ V GS
2200 μ F
1 kΩ
PW
I G = CONST
2.7 k Ω
47 k Ω
100 Ω
D.U.T.
VG
AM01469v 1
Figure 16: Test circuit for inductive load switching
and diode recovery times
Figure 17: Unclamped inductive load test circuit
G
25 Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100 µH
B
3.3
B
µF
D
G
D.U.T.
RG
S
1000
µF
VDD
AM01470v1
Figure 18: Unclamped inductive waveform
V_{(B R)DS S}
V_D
V_DD
I _DM
I_D
V_DD
AM01472v 1
Figure 19: Switching time waveform
t _on
t _d(on)
t_r
t_off
t _d(off)
t_f
90%
90%
10%
0
10%
V_DS
90%
V_GS
0
10%
AM01473v 1
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DocID027601 Rev 2