STB6N65M2 Datasheet, PDF (8/23 Pages) STMicroelectronics – Zener-protected

Test circuits
3
Test circuits
STB6N65M2, STD6N65M2
Figure 13. Switching times test circuit for
resistive load
VD
VGS
RG
PW
RL
2200
μF
D.U.T.
3.3
μF _VDD
AM01468v1
Figure 14. Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
Vi=20V=VGMAX
2200
μF
IG=CONST
2.7kΩ
100Ω
D.U.T.
VG
47kΩ
PW
1kΩ
AM01469v1
Figure 15. Test circuit for inductive load
switching and diode recovery times
Figure 16. Unclamped inductive load test circuit
G
25 Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100μH
B
3.3
B
μF
D
G
RG
S
1000
μF
VDD
Vi
L
VD
2200
3.3
μF
μF
VDD
ID
D.U.T.
AM01470v1
Figure 17. Unclamped inductive waveform
9%5'66
9'
Pw
AM01471v1
Figure 18. Switching time waveform
ton
toff
tdon
tr
tdoff tf
9''
,'0
,'
0
9''
90%
10% VDS
90%
VGS
90%
10%
$0Y
0
10%
AM01473v1
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DocID026762 Rev 1