CLP200M Datasheet, PDF (8/21 Pages) STMicroelectronics – OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE

CLP200M
3. CLP200MTESTS RESULTS ACCORDING TO
CCITT K20 RECOMMENDATIONS
3.1 CCITT K20 Recommendations
In respect with the CCITT recommendations, the
CLP200M has to withstand three kinds of distur-
bances.
3.1.1. Lightning simulation
(Test 2, table 2/K20)
This test shall be done in transversaland longitudi-
nal modes as shown in figure 10.
Fig. 10 : Transversal and longitudinal test
topologies.
15
4kv
20µF
50
25
0.2µF
A or B
B or A
ITEM
UNDER
TEST
E
Fig. 11 : Power induction test circuit.
1µF
R1
S2
1µ F
100
S1 _R2
A
ITEM
UNDER
TEST
BE
3.1.3. Power contact (Test 3, table 1/K20)
This test shall be done with the test circuit of figure
12.
Vac(max) = 220V_RMS , with switch S in each posi-
tion and duration 15 min.
Fig. 12 : Power contact test circuit.
TRANSVERSAL TEST
25
15
25
A
ITEM
UNDER
B
TEST
4kv
20µF
50
0.2µF
E
LONGITUDINAL TEST
The test generator is the 10/700µs with 4kV of
peak voltage.
3.1.2. Power induction
(Test 3a and 3b, table 2/K20)
Two kinds of tests using the same circuit topology
(see fig.11) are defined in the CCITT K20.
Test 3a :
Vac(max) = 300V_RMS, R1 = R2 = 600Ω
S2 operating and test duration = 200 ms.
Test 3b :
Vac(max) = 300VRMS (*), R1 = R2 = 200Ω
S2 operating and test duration not defined.
<10
600
A
ITEM
UNDER
<10
TEST
600
BE
3.1.4. Acceptance criteria and number of tests
For the tests described in chapter3.1.1., 3.1.2.and
3.1.3. two criteria are defined :
A: Equipment shall withstand the test without dam-
age and shall operate properly within the specified
limits.
B: A fire hazard should not occur in the equipment
as a result of the tests.
The criteria are affected to the different tests as
mentioned in the table 1.
(*) Recommended value.
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