THBT7011D Datasheet, PDF (5/8 Pages) STMicroelectronics – DUAL OVERVOLTAGE PROTECTION FOR TELECOM LINE

TEST CIRCUIT 2 for IH parameter.
THBT7011D
R
V_BAT = - 48 V
D.U.T.
- V_P
Surge generator
This is a GO-NOGO test which allows to confirm the holding current (I_H) level in a functional
test circuit.
TEST PROCEDURE :
1) Adjust the current level at the I_H value by short circuiting the AK of the D.U.T.
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs.
3) The D.U.T will come back off-state within 50 ms max.
TEST CIRCUIT 3 for I_PP and V_BO parameters :
(VP is defined in no load condition)
L
R₂
V_P
C₁
R₁
R₄
R₃
C₂
TIP
R ING
G ND
Pulse (µs)
tr
tp
V_p
C₁
C₂
L
R₁
R₂
R₃
R₄
I_PP
R_p
(V) (µF) (nF) (µH) (Ω) (Ω) (Ω) (Ω) (A) (Ω)
10 700 1500 20 200
0
50
15
25
25
30
10
1.2 50 1500 1
33
0
76
13
25
25
30
10
2
10 2500 10
0
1.1 1.3
0
3
3
38
62
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