AN987 Datasheet, PDF (3/10 Pages) STMicroelectronics – ST7 SERIAL TEST CONTROLLER PROGRAMMING

ST7 SERIAL TEST CONTROLLER PROGRAMMING
Figure 1. User Board
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Now, let’s define the pins used for programming the ST7. These pins are put together in the
W1 connector implemented in all the ST programming tool boards (see Section 3 APPENDIX
1 for the pin connector assignment).
All the ST7 programming tools referred to in this note (ST7 starter kits and ST7 EPBs in the
MDT1, MDT3 and MDT4 tool families) use a programming technique called JTAG (Joint Test
Action Group).
These programming tools control 11 pins:
s 5 JTAG pins and 3 test mode pins, which are used for loading the software code into the
ST7. These pins are:
– Pin TCK: the test clock (input),
– Pin TMS: the Test Mode Select (input, weak pull-up),
– Pin TRST0: the Reset (Input, weak pull-up, active low)
– Pin TDI: the Test Data In (input, weak pull-up). This is the serial data input, sampled on
the rising edge of TCK.
– Pin TDO: the Test Data Out (tri-state output). This is the serial data output, updated on the
falling edge of TCK.
– Pins M0, M1 and M2: These 3 pins are used to force the test modes.
Depending on the device selected, these 8 pins will be associated with different pin num-
bers (see APPENDIX 1).
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