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STM32L15XCC Datasheet, PDF (104/136 Pages) STMicroelectronics – Reset and supply management
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Electrical characteristics
STM32L151xC STM32L152xC
Table 59. DAC characteristics (continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
dOffset/dT(1)
Offset error temperature
coefficient (code 0x800)
VDDA = 3.3V
VREF+ = 3.0V
TA = 0 to 50 ° C
DAC output buffer OFF
VDDA = 3.3V
VREF+ = 3.0V
TA = 0 to 50 ° C
DAC output buffer ON
Gain(1)
Gain error(7)
CL ≤ 50 pF, RL ≥ 5 kΩ
DAC output buffer ON
No RL, CL ≤ 50 pF
DAC output buffer OFF
dGain/dT(1)
Gain error temperature
coefficient
VDDA = 3.3V
VREF+ = 3.0V
TA = 0 to 50 ° C
DAC output buffer OFF
VDDA = 3.3V
VREF+ = 3.0V
TA = 0 to 50 ° C
DAC output buffer ON
TUE(1)
Total unadjusted error
CL ≤ 50 pF, RL ≥ 5 kΩ
DAC output buffer ON
No RL, CL ≤ 50 pF
DAC output buffer OFF
tSETTLING
Settling time (full scale:
for a 12-bit code
transition between the
lowest and the highest
input codes till
DAC_OUT reaches final
value ±1LSB
CL ≤ 50 pF, RL ≥ 5 kΩ
Update rate
Max frequency for a
correct DAC_OUT
change (95% of final
value) with 1 LSB
variation in the input
code
CL ≤ 50 pF, RL ≥ 5 kΩ
tWAKEUP
Wakeup time from off
state (setting the ENx bit
in the DAC Control
register)(8)
CL ≤ 50 pF, RL ≥ 5 kΩ
PSRR+
VDDA supply rejection
ratio (static DC
measurement)
CL ≤ 50 pF, RL ≥ 5 kΩ
-20
-10
0
20
0
µV/°C
50
- +0.1 / -0.2% +0.2 / -0.5%
%
- +0 / -0.2% +0 / -0.4%
-10
-2
-40
-8
0
µV/°C
0
-
12
-
8
30
LSB
12
-
7
12
µs
-
-
1
Msps
-
9
-
-60
15
µs
-35
dB
1. Data based on characterization results.
2. Connected between DAC_OUT and VSSA.
3. Difference between two consecutive codes - 1 LSB.
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