SST89E52RD2_06 Datasheet, PDF (66/81 Pages) Silicon Storage Technology, Inc – FlashFlex51 MCU

FlashFlex51 MCU
SST89E52RD2/RD / SST89E54RD2/RD / SST89E58RD2/RD
SST89V52RD2/RD / SST89V54RD2/RD / SST89V58RD2/RD
Data Sheet
2. Capacitive loading on Ports 0 and 2 may cause spurious noise to be superimposed on the V_OLs of ALE and Ports 1 and 3. The noise
due to external bus capacitance discharging into the Port 0 and 2 pins when the pins make 1-to-0 transitions during bus operations.
In the worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable
to qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input.
3. Load capacitance for Port 0, ALE and PSEN#= 100pF, load capacitance for all other outputs = 80pF.
4. Capacitive loading on Ports 0 and 2 may cause the V_OH on ALE and PSEN# to momentarily fall below the V_DD - 0.7 specification
when the address bits are stabilizing.
5. Pins of Ports 1, 2, and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches
its maximum value when V_IN is approximately 2V.
6. Pin capacitance is characterized but not tested. EA# is 25pF (max).
©2006 Silicon Storage Technology, Inc.
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