S29JL032H_09 Datasheet, PDF (46/61 Pages) SPANSION – 32 Megabit (4 M x 8-Bit/2 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Read/Write Flash Memory

15. Test Conditions
Data Sheet
Device
Under
Test
Figure 15.1 Test Setup
3.3 V
2.7 kΩ
C_L
6.2 kΩ
Note
Diodes are IN3064 or equivalent.
Table 15.1 Test Specifications
Test Condition
Output Load
Output Load Capacitance, C_L
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference levels
Output timing measurement reference levels
60
70, 90
Unit
1 TTL gate
30
100
pF
5
ns
0.0 or Vcc
V
0.5 Vcc
V
0.5 Vcc
V
16. Key To Switching Waveforms
Waveform
Inputs
Steady
Outputs
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
Vcc
0.0 V
Figure 16.1 Input Waveforms and Measurement Levels
Input
0.5 Vcc
Measurement Level
0.5 Vcc Output
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S29JL032H
S29JL032H_00_B8 August 31, 2009