S25FL128P_12 Datasheet, PDF (40/49 Pages) SPANSION – 128 Megabit CMOS 3.0 Volt Flash Memory with 104-MHz SPI (Serial Peripheral Interface) Bus

Data Sheet
Table 13.1 Power-Up / Power-Down Voltage and Timing
Symbol
V_CC(min)
V_CC(cut-off)
V_CC(low)
t_PU
t_PD
Parameter
V_CC (minimum operation voltage)
V_CC (Cut off where re-initialization is needed)
V_CC (Low voltage for initialization to occur at read/standby)
V_CC (Low voltage for initialization to occur at embedded)
V_CC (min) to device operation
V_CC (low duration time)
Min
Max
Unit
2.7
V
2.4
V
0.2
V
2.3
300
µs
1.0
µs
14. Initial Delivery State
The device is delivered with all bits set to 1 (each byte contains FFh) upon initial factory shipment. The Status
Register contains 00h (all Status Register bits are 0).
15. Absolute Maximum Ratings
Do not stress the device beyond the ratings listed in this section, or serious, permanent damage to the device
may result. These are stress ratings only and device operation at these or any other conditions beyond those
indicated in this section and in the Operating Ranges section of this document is not implied. Device
operation for extended periods at the limits listed in this section may affect device reliability.
Table 15.1 Absolute Maximum Ratings
Description
Rating
Ambient Storage Temperature
–65°C to +150°C
Voltage with Respect to Ground: All Inputs and I/Os
–0.5V to V_CC+0.5V
Notes
1. Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, input at I/O pins may overshoot V_SS to –2.0V for periods of
up to 20 ns. See Figure 15.2. Maximum DC voltage on output and I/O pins is 3.6 V. During voltage transitions output pins may overshoot
to V_CC + 2.0V for periods up to 20 ns. See Figure 15.2.
2. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second.
3. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only;
functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not
implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability.
Figure 15.1 Maximum Negative Overshoot Waveform
+0.8 V
–0.5 V
–2 V
20 ns
20 ns
20 ns
40
S25FL128P
S25FL128P_00_11 September 21, 2012