SI7020-A10 Datasheet, PDF (5/34 Pages) Silicon Laboratories – Excellent long term stability

Si7020-A10
Table 2. General Specifications (Continued)
1.9 < VDD < 3.6 V; TA = –40 to 85 °C (G grade) or –40 to 125 °C (I/Y grade); default conversion time unless otherwise noted.
Parameter
Symbol
Test Condition
Min
Conversion Time¹
t_CONV
12-bit RH
—
11-bit RH
—
10-bit RH
—
8-bit RH
—
14-bit temperature
—
13-bit temperature
—
12-bit temperature
—
11-bit temperature
—
Powerup Time
t_PU
From VDD ≥ 1.9 V to ready for a
—
conversion, 25 °C
From VDD ≥ 1.9 V to ready for a con-
—
version, full temperature range
After issuing a software reset
—
command
Typ
Max Unit
10
12
5.8
7
3.7
4.5
2.6
3.1
ms
7
10.8
4
6.2
2.4
3.8
1.5
2.4
18
25
—
80
ms
5
15
Notes:
1. Initiating a RH measurement will also automatically initiate a temperature measurement. The total conversion time will
2.
be
No
tc_{CoOnNvVe(rRsHio)n+otrCIO2CNVt(rTan).saction}
in
progress.
Typical
values
measured
at
25
°C.
3. Occurs once during powerup. Duration is <5 msec.
4. Occurs during I²C commands for Reset, Read/Write User Registers, Read EID, and Read Firmware Version. Duration is
<100 µs when I²C clock speed is >100 kHz (>200 kHz for 2-byte commands).
5. IDD after a user register write. Initiating any other subsequent I²C transaction on the same bus (such as the user
register read, starting an RH measurement, or traffic directed at other I²C devices) will transition the device to standby
mode.
6. Additional current consumption when HTRE bit enabled. See section “5.5. Heater” for more information
Rev. 1.1
5