EFR32MG1B732F256 Datasheet, PDF (43/94 Pages) Silicon Laboratories – EFR32MG1 Mighty Gecko SoC with Integrated Serial Flash Data Sheet

EFR32MG1 Mighty Gecko SoC with Integrated Serial Flash Data Sheet
Electrical Specifications
Parameter
Symbol
Test Condition
Min
Current from all supplies, us- I_{ADC_NORMAL_HP} 35 ksps / 16 MHz ADCCLK,
—
ing internal reference buffer.
Duty-cycled operation. WAR-
BIASPROG = 0, GPBIASACC = 0
MUPMODE² = NORMAL
3
5 ksps / 16 MHz ADCCLK
—
BIASPROG = 0, GPBIASACC = 0
3
Current from all supplies, us- I_{ADC_STAND-}
125 ksps / 16 MHz ADCCLK,
—
ing internal reference buffer. _{BY_HP}
Duty-cycled operation.
BIASPROG = 0, GPBIASACC = 0
AWARMUPMODE² = KEEP-
3
INSTANDBY or KEEPIN-
SLOWACC
35 ksps / 16 MHz ADCCLK,
—
BIASPROG = 0, GPBIASACC = 0
3
Current from HFPERCLK
I_{ADC_CLK}
HFPERCLK = 16 MHz
—
ADC Clock Frequency
f_ADCCLK
—
Throughput rate
f_ADCRATE
—
Conversion time⁴
t_ADCCONV
6 bit
—
8 bit
—
12 bit
—
Startup time of reference
t_ADCSTART
WARMUPMODE² = NORMAL
—
generator and ADC core
WARMUPMODE² = KEEPIN-
—
STANDBY
WARMUPMODE² = KEEPINSLO-
—
WACC
SNDR at 1Msps and f_in =
10kHz
SNDR_ADC
Internal reference, 2.5 V full-scale,
58
differential (-1.25, 1.25)
vrefp_in = 1.25 V direct mode with
—
2.5 V full-scale, differential
Spurious-Free Dynamic
SFDR_ADC
1 MSamples/s, 10 kHz full-scale
—
Range (SFDR)
sine wave
Input referred ADC noise,
V_{REF_NOISE}
Including quantization noise and
—
rms
distortion
Offset Error
V_ADCOFFSETERR
-3
Gain error in ADC
V_{ADC_GAIN}
Using internal reference
—
Using external reference
—
Differential non-linearity
DNL_ADC
12 bit resolution
-1
(DNL)
Integral non-linearity (INL), INL_ADC
12 bit resolution
-6
End point method
Temperature Sensor Slope V_{TS_SLOPE}
—
Typ
102
17
162
123
140
—
—
7
9
13
—
—
—
67
68
75
380
0.25
-0.2
-1
—
—
-1.84
Max
Unit
—
μA
—
μA
—
μA
—
μA
—
μA
16
MHz
1
Msps
—
cycles
—
cycles
—
cycles
5
μs
2
μs
1
μs
—
dB
—
dB
—
dB
—
μV
3
LSB
5
%
—
%
2
LSB
6
LSB
—
mV/°C
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