S-57B1 Datasheet, PDF (7/20 Pages) Seiko Instruments Inc – OPERATION HIGH-SPEED UNIPOLAR DETECTION TYPE HALL IC

125°C OPERATION HIGH-SPEED UNIPOLAR DETECTION TYPE HALL IC
Rev.3.0_00
S-57B1 Series
 Test Circuits
A
R^*1
100 kΩ
VDD
S-57B1
Series ^OUT
VSS
*1. Resistor (R) is unnecessary for the CMOS output product.
Figure 4 Test Circuit 1
VDD
S-57B1
Series ^OUT
A
VSS
V
Figure 5 Test Circuit 2
VDD
S-57B1
Series ^OUT
A
VSS
V
Figure 6 Test Circuit 3
7