S-801 Datasheet, PDF (18/33 Pages) Seiko Instruments Inc – ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
S-801 Series
Rev.3.3_00
2. Hysteresis Width (V_HYS)
Hysteresis width is the voltage difference between the detection voltage and the release voltage
(The voltage at point B−The voltage at point A=V_HYS in Figure 11). The existence of the hysteresis
width prevents malfunction caused by noise on input signal.
3. Delay Time (t_D)
Delay time is a time internally measured from the instant at which input voltage to the VDD pin
exceeds the release voltage (+V_DET) to the point at which the output of the OUT pin inverts. The
delay time is fixed in each series distinguished by A, B and C.
S-801xxAx series: typ. 50 ms
S-801xxBx series: typ. 100 ms
S-801xxCx series: typ. 200 ms
The output of the OUT pin can be inverted in a short delay time (t_D2) by setting the DS pin High (Refer
to Figure 16).
V
V_DD
+V_DET
at DS=”H”
OUT
t_D1
t_D2
Figure 16
4. Through-type Current
The through-type current refers to the current that flows instantaneously at the time of detection and
release of a voltage detector. The through-type current flows at a frequency of 20 kHz during release
delay time since the internal logic circuit operates.
18
Seiko Instruments Inc.