S-801 Datasheet, PDF (16/33 Pages) Seiko Instruments Inc – ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
S-801 Series
Rev.3.3_00
3-2. Temperature Characteristics of Release Voltage
The temperature coefficient ^{Δ + VDET} of the release voltage is calculated by the temperature
ΔTa
coefficient ^{Δ − VDET} for the detection voltage as follows:
ΔTa
Δ + VDET ₌ +VDET _× Δ − VDET
ΔTa
− VDET ΔTa
The temperature coefficients for the release voltage and the detection voltage have the same sign
consequently.
3-3. Temperature Characteristics of Hysteresis Voltage
The temperature characteristics for the hysteresis voltage is expressed as ^{Δ + VDET} − ^{Δ − VDET} and
ΔTa
ΔTa
is calculated as follows:
Δ + VDET _− Δ − VDET ₌ VHYS _× Δ − VDET
ΔTa
ΔTa
− VDET ΔTa
„ Standard Circuit
VDD
DS
OUT
VSS
R^*1
100 kΩ
*1. R is unnecessary for CMOS output products.
Figure 13
Caution The above connection diagram and constant will not guarantees successful operation.
Perform through using the actual application to set the constant.
16
Seiko Instruments Inc.