S-8261 Datasheet, PDF (13/36 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR SINGLE-CELL PACK

Rev.1.9_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Table 11
S-8261ABD
Parameter
Symbol
Test
condition
Remark
Min.
Typ.
Max.
Unit
Test
circuit
[DELAY TIME] 25°C
Overcharge detection delay time
t_CU
9

1.48 1.84 2.2 s
5
Overdischarge detection delay time t_DL
9

92 115 138 ms 5
Overcurrent 1 detection delay time t_lOV1
10

5.76 7.2 8.8 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10
[DELAY TIME] −40°C to +85°C^*1

2.88 3.6 4.32 ms 5

358 488 586 µs 5
Overcharge detection delay time
t_CU
9

1.11 1.84 2.89 s
5
Overdischarge detection delay time t_DL
9

68.9 115 182.3 ms 5
Overcurrent 1 detection delay time t_lOV1
10

4.31 7.2 11.59 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10

2.16 3.6 5.68 ms 5

268 488 770 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Table 12
S-8261ABG, S-8261ABI, S-8261ABL
Parameter
Symbol
Test
condition
Remark
Min.
Typ.
Max.
Unit
Test
circuit
[DELAY TIME] 25°C
Overcharge detection delay time
t_CU
9

0.96 1.2 1.4 s
5
Overdischarge detection delay time t_DL
9

29 36 43 ms 5
Overcurrent 1 detection delay time t_lOV1
10

7.2 9 11 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10

1.8 2.24 2.7 ms 5

220 320 380 µs 5
[DELAY TIME] −40°C to +85°C^*1
Overcharge detection delay time
t_CU
9

0.7 1.2 2.0 s
5
Overdischarge detection delay time t_DL
9

20 36 61 ms 5
Overcurrent 1 detection delay time t_lOV1
10

5 9 15 ms 5
Overcurrent 2 detection delay time t_lOV2
10

1.2 2.24 3.8 ms 5
Load short-circuiting detection delay
time
t_SHORT
10

150 320 540 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Seiko Instruments Inc.
13