S-8261 Datasheet, PDF (11/36 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR SINGLE-CELL PACK

Rev.1.9_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
3. Detection Delay Time
Table 7
S-8261AAG, S-8261AAH, S-8261AAJ, S-8261AAL, S-8261AAM, S-8261AAN, S-8261AAO, S-8261AAP,
S-8261AAR, S-8261AAZ, S-8261ABB, S-8261ABC, S-8261ABE, S-8261ABJ, S-8261ABK, S-8261ABM,
S-8261ABN, S-8261ABO, S-8261ABP, S-8261ABR, S-8261ABS
Parameter
Symbol
Test
condition
Remark
Min.
Typ.
Max.
Unit
Test
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
t_CU
9

0.96 1.2 1.4 s
5
Overdischarge detection delay time t_DL
9

115 144 173 ms 5
Overcurrent 1 detection delay time t_lOV1
10

7.2 9 11 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10

1.8 2.24 2.7 ms 5

220 320 380 µs 5
[DELAY TIME] −40 °C to +85 °C^*1
Overcharge detection delay time
t_CU
9

0.7 1.2 2.0 s
5
Overdischarge detection delay time t_DL
9

80 144 245 ms 5
Overcurrent 1 detection delay time t_lOV1
10

5 9 15 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10

1.2 2.24 3.8 ms 5

150 320 540 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Table 8
S-8261AAS
Parameter
Symbol
Test
condition
Remark
Min.
Typ. Max.
Unit
Test
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
t_CU
9

0.96 1.2 1.4 s
5
Overdischarge detection delay time t_DL
9

115 144 173 ms 5
Overcurrent 1 detection delay time t_lOV1
10

3.6 4.5 5.4 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10
[DELAY TIME] −40 °C to +85 °C^*1

1.8 2.24 2.7 ms 5

220 320 380 µs 5
Overcharge detection delay time
t_CU
9

0.7 1.2 2.0 s
5
Overdischarge detection delay time t_DL
9

80 144 245 ms 5
Overcurrent 1 detection delay time t_lOV1
10

2.5 4.5 7.7 ms 5
Overcurrent 2 detection delay time t_lOV2
10
Load short-circuiting detection delay
time
t_SHORT
10

1.2 2.24 3.8 ms 5

150 320 540 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Seiko Instruments Inc.
11