S-8211C Datasheet, PDF (13/41 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 1-CELL PACK

Rev.5.0_00
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
(5) S-8211CAF, S-8211CAO, S-8211CAP, S-8211CAQ, S-8211CBD, S-8211CBO
Table 14
Test _Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condi-
tion
Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C) ^*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
tCU
tDL
tDIOV
tSHORT
tCIOV
−
0.96 1.2 1.4 s 9
5
−
30 38 46 ms 9
5
−
7.2
9
11 ms 10
5
−
240 300 360 µs 10
5
−
7.2
9
11 ms 10
5
−
0.7 1.2 2.0 s 9
5
−
20 38 65 ms 9
5
−
5
9
15 ms 10
5
−
150 300 540 µs 10
5
−
5
9
15 ms 10
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
(6) S-8211CAW
Table 15
Test
Test
Item
Symbol
Condition
Min. Typ. Max. Unit Condi-
Circuit
tion
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C) ^*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
tCU
tDL
tDIOV
tSHORT
tCIOV
−
0.96 1.2 1.4 s 9
5
−
120 150 180 ms 9
5
−
3.6 4.5 5.4 ms 10
5
−
240 300 360 µs 10
5
−
7.2
9
11 ms 10
5
−
0.7 1.2 2.0 s 9
5
−
83 150 255 ms 9
5
−
2.5 4.5 7.7 ms 10
5
−
150 300 540 µs 10
5
−
5
9
15 ms 10
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
Seiko Instruments Inc.
13