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| AM101-DP Datasheet, PDF (9/13 Pages) Seoul Semiconductor – Surface-mounted chip LED device | |||
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6. Reliability Tests
Item
Condition
Note Failures
Life Test
Ta = RT, IF = 20mA
1000hrs
0/22
High Temperature Operating
Ta = 85ºC, IF = 20mA
1000hrs
0/22
Low Temperature Operating
Ta = -30ºC, IF = 20mA
1000hrs
0/22
Thermal Shock
Ta = -30ºC (30min) ~ 85ºC (30min)
(Transfer time : 10sec, 1Cycle = 1hr)
100
cycles
0/40
Resistance to soldering Heat
Ts = 255 ± 5ºC, t = 10sec
1 time
0/22
ESD
(Human Body Model)
2kV, 1.5kΩ ; 100pF
1 time
0/22
High Temperature Storage
Ta = 100ºC
1000hrs
0/22
Low Temperature Storage
Temperature Humidity
Storage
Temperature Humidity
Operating
Ta = -40ºC
Ta = 85ºC, RH = 85%
1000hrs
0/22
1000hrs
0/22
Ta = 85ºC, RH = 85%, IF = 20mA
100hrs
0/22
< Judging Criteria For Reliability Tests >
VF
USL[1] X 1.2
IR
USL X 2.0
ФV
LSL [2] X 0.7
Notes :
[1] USL : Upper Standard Level
[2] LSL : Lower Standard Level.
Rev. 00
September 2008
www.ZLED.com
Document No. : SSC-QP-7-07-24 (Rev.00)
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