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| C9WT728 Datasheet, PDF (6/17 Pages) Seoul Semiconductor – Specification | |||
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5. Reliability Test
Item
Thermal Shock
High Temperature
Storage
High Temp. High
Humidity Storage
Low Temperature
Storage
Operating
Endurance Test
High Temperature
High Humidity Life
Test
High Temperature
Life Test
Low Temperature
Life Test
ESD(HBM)
Reference
EIAJ
ED-4701
EIAJ
ED-4701
EIAJ
ED-4701
EIAJ
ED-4701
Internal
Reference
Internal
Reference
Internal
Reference
Internal
Reference
MIL-STD-
883D
Test Conditions
Ta =-40oC(30min) ~
100oC(30min)
Ta =100oC
Ta =60oC, RH=90%
Ta =-40oC
Ta =25oC, IF =60mA
Duration /
Cycle
1000
Cycle
Number
of
Damaged
0/22
1000 Hours
0/22
1000 Hours
0/22
1000 Hours
0/22
1000 Hours
0/22
Ta =60oC, RH=90%, IF =60mA
500
Hours
0/22
Ta =85oC, IF =60mA
Ta =-40oC, IF =60mA
1KV at 1.5kâ¦; 100pF
1000 Hours
1000 Hours
3 Time
0/22
0/22
0/22
â¡ CRITERIA FOR JUDGING THE DAMAGE
Item
Symbol
Condition
Forward Voltage
VF
Reverse Current
IR
Luminous Intensity
IV
IF =60mA
(20mA per die)
VR=5V
IF =60mA
(20mA per die)
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
Criteria for Judgment
MIN
MAX
-
USL*1 Ã 1.2
-
USL*1 Ã 2.0
LSL*2 Ã 0.5
-
Rev. 03
June 2009
www.acriche.com
SSC-QP-7-07-24 (Rev.00)
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