EWT801-S Datasheet, PDF (10/21 Pages) Seoul Semiconductor – Package: White PLCC2 White Color Technology: InGan/Gan

APCPCWM_4828539:WP_0000001WP_0000001
5 Reliability
(1) TEST ITEMS AND RESULTS
Test Item
Resistance to
Soldering Heat
(Reflow soldering)
Solderability
(Reflow Soldering)
Thermal Shock
Temperature Cycle
High Temperature Storage
Low Temperature Storage
Room temperature Operating
Life **
Steady State Operating Life of
High Temperature
Steady State Operating Life of
High Humidity Heat
Steady State Operating Life of
Low Temperature
Power and Temperature Cycle
Vibration
Electrostatic Discharge
Standard
Test Method
Test Condition
JEITA ED-4701
300 301
Tsld=260℃, 10sec.
(Pre treatment 30^oC,70%,168hrs.)
JEITA ED-4701
300 303
JEITA ED-4701
300 307
JEITA ED-4701
100 105
JEITA ED-4701
200 201
JEITA ED-4701
200 202
Internal
Reference
Internal
Reference
Internal
Reference
Internal
Reference
JESD22
A-105
JEITA ED-4701
400 403
Tsld=215±5℃, 3sec.
(using flux, Lead Solder)
-40℃ ~ 110℃
20min. (10sec.) 20min.
-40℃ ~ 25℃ ~ 110℃ ~ 25℃
25min. 5min. 25min. 5min
T_a =100℃
T_a =-40℃
T_a =25℃, I_F =30mA
T_a =100℃, I_F =17mA
85℃, RH=85%, I_F =25mA
T_a =-40℃, I_F =30mA
T_a=-40℃(20min) ~ 85℃(20min)
(Transfer time:20min,1Cycle=1hr)
I_F =25mA , 2 min. on/off
200m/s², 100~2000Hz (Sweep 4min.)
48min., 3 directions
JEITA ED-4701
300 304
R=1.5kΩ, C= 100pF
Test Voltage = 2kV
Duration
/ Cycle
2 times
1 time
Over 95%
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
Number
of
Damage
0/30
0/30
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
1000 hrs.
0/77
4 times
3 Times
Negative
/Positive
0/30
0/30
(2) Criteria for Judging the Damage
Item
Forward Voltage
Luminous Intensity
Symbol
V_F
I_V
Condition
I_F =20mA
I_F =20mA
Criteria for Judgment
MIN
MAX
-
Initial × 1.2
Initial × 0.8
-
EWT801-S
10/ 21
Rev. 04
29. November. 2011
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