TCFG_C Datasheet, PDF (7/12 Pages) Rohm – Chip tantalum capacitors with (Fail-safe open structure type)

Tantalum capacitors
z Recommended condition of reflow soldering
(1) Leakage current-to-voltage ratio
1
TCFG series C Case
0.1
0.01
0
20 40 60 80 100
% OF RATED VOLTAGE (VR)
Fig.1
(2) Derating voltage as function of temperature
100
85°C
90
Rated Voltage
Surge Voltage
(V.DC)
(V.DC)
80
2.5
3.2
4
5.0
70
6.3
8
60
10
13
16
20
50
75
85
95
105 115 125
20
26
TEMPERATURE ( C)
25
32
Fig.2
125°C
Category Voltage Surge Voltage
(V.DC)
(V.DC)
1.6
2.0
2.5
3.2
4
5
6.3
8
10
13
13
16
16
20
(3) Reliability
The malfunction rate of tantalum solid state electrolytic capacitors varies considerably depending on the conditions of
usage (ambient temperature, applied voltage, circuit resistance).
Formula for calculating malfunction rate
Op = Ob u (SE u SSR u SQ u SCV)
Op : Malfunction rate stemming from operation
Ob : Basic malfunction rate
SE : Environmental factors
SSR : Series resistance
SQ : Level of malfunction rate
SCV : Capacitance
For details on how to calculate the malfunction rate stemming from operation, see the tantalum solid state electrolytic
capacitors column in MIL-HDBK-217.
Rev.C
7/11