R1111N_17 Datasheet, PDF (7/18 Pages) RICOH electronics devices division – LOW NOISE 150mA LDO REGULATOR

TEST CIRCUITS
CE
3
IN ^VDD
VOUT _OUT
1 R1111Nxx1B Series 5
IOUT
0.1μF
2
GND
2.2μF
Fig.1 Standard test Circuit
CE
3
IN ^VDD
VOUT _OUT
1 R1111Nxx1B Series 5
IOUT
P.G
2
GND
Fig.3 Ripple Rejection, Line Transient
Response Test Circuit
R1111N
CE
3
IN ^VDD
1
ISS
R1111Nxx1B Series
VOUT _OUT
5
0.1μF
2
GND
2.2μF
Fig.2 Supply Current Test Circuit
CE
3
IN ^VDD
VOUT
1 R1111Nxx1B Series 5
OUT
2
1μF
GND
I1 I2
Fig.4 Load Transient Response Test Circuit
7