2SC4196 Datasheet, PDF (6/8 Pages) Hitachi Semiconductor – Silicon NPN Epitaxial

2SC4196
Test Condition
Freq.
(MHz)
100
200
300
400
500
600
700
800
900
1000
Yie (mS)
REAL
IMAG.
5.903
7.347
11.583
10.820
16.546
10.993
20.055
10.038
22.491
8.943
24.417
7.556
26.086
6.620
27.193
5.569
28.543
4.340
28.955
3.253
Yfe (mS)
REAL
IMAG.
243.307 –103.091
168.225 –150.806
103.210 –155.623
61.965 –145.393
35.421 –131.365
16.762 –118.513
5.096
–107.291
–3.874
–97.359
–11.095 –88.952
–15.953 –81.466
Yre (mS)
REAL
IMAG.
–0.008
–0.338
–0.022
–0.682
–0.045
–1.041
–0.074
–1.387
–0.093
–1.766
–0.133
–2.138
–0.155
–2.531
–0.185
–2.923
–0.248
–3.349
–0.270
–3.737
V_CE = 5 V, I_C = 10 mA
Yoe (mS)
REAL
IMAG.
0.026
0.591
0.128
1.254
0.216
1.797
0.320
2.394
0.316
2.917
0.378
3.544
0.424
4.086
0.469
4.659
0.563
5.307
0.650
5.861
V_OSC Test Circuit
V_osc Test Circuit
L₃
1n
Ferrite
Bead
470
D.U.T.
9p
L₁
1.2 p
L₂
2.2 n
330
6.8 k
1n
V_CC
47 k 1 n
V_T
ISV188
Unit R : Ω
C:F
V_osc
V_BB
Output
L₁ : φ0.8 mm Enameled Copper Wire.
L₂ : φ0.8 mm Enameled Copper Wire.
15
5
15
Unit : mm
15
L₃ : Inside dia 3 mm, φ0.3 mm Enameled Copper Wire 10 Turns.
Rev.3.00 Aug 10, 2005 page 6 of 7