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R1LP0108E_15 Datasheet, PDF (10/17 Pages) Renesas Technology Corp – 1Mb Advanced LPSRAM (128k word x 8bit)
R1LP0108E Series
Write Cycle
Parameter
Write cycle time
Address valid to end of write
Chip select to end of write
Write pulse width
Address setup time
Write recovery time
Data to write time overlap
Data hold from write time
Output enable from end of write
Output disable to output in high-Z
Write to output in high-Z
Symbol
tWC
tAW
tCW
tWP
tAS
tWR
tDW
tDH
tOW
tOHZ
tWHZ
R1LP0108E**-5**
Min.
Max.
55
-
50
-
50
-
45
-
0
-
0
-
25
-
0
-
5
-
0
20
0
20
R1LP0108E**-7**
Min.
Max.
70
-
55
-
55
-
50
-
0
-
0
-
30
-
0
-
5
-
0
25
0
25
Unit
Note
ns
ns
ns
5
ns
4
ns
6
ns
7
ns
ns
ns
2
ns
1,2
ns
1,2
Note
1. tCHZ, tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit conditions and are not
referred to output voltage levels.
2. This parameter is sampled and not 100% tested.
3. At any given temperature and voltage condition, tHZ max is less than tLZ min both for a given device and from
device to device.
4. A write occurs during the overlap of a low CS1#, a high CS2, a low WE#.
A write begins at the latest transition among CS1# going low, CS2 going high and WE# going low.
A write ends at the earliest transition among CS1# going high, CS2 going low and WE# going high.
tWP is measured from the beginning of write to the end of write.
5. tCW is measured from the later of CS1# going low or CS2 going high to end of write.
6. tAS is measured the address valid to the beginning of write.
7. tWR is measured from the earliest of CS1# or WE# going high or CS2 going low to the end of write cycle.
8. Don’t apply inverted phase signal externally when DQ pin is output mode.
R10DS0029EJ0300 Rev.3.00
2013.6.21
Page 10 of 15