SA5211 Datasheet, PDF (9/20 Pages) NXP Semiconductors – Transimpedance amplifier 180MHz

Philips Semiconductors
Transimpedance amplifier (180MHz)
Product specification
SA5211
TEST CIRCUITS (Continued)
Typical Differential Output Voltage
vs Current Input
5V
I_IN (µA)
OUT +
IN DUT
OUT –
GND₁
GND₂
+
V_OUT (V)
–
1998 Oct 07
2.00
1.60
1.20
0.80
0.40
0.00
–0.40
–0.80
–1.20
–1.60
–2.00
–100
–80
–60
–40
–20
0
20
CURRENT INPUT (µA)
40
60
80
100
NE5211 TEST CONDITIONS
Procedure 1
R_T measured at 15µA
R_T = (V_O1 – V_O2)/(+15µA – (–15µA))
Where: V_O1 Measured at I_IN = +15µA
V_O2 Measured at I_IN = –15µA
Procedure 2
Linearity = 1 – ABS((V_OA – V_OB) / (V_O3 – V_O4))
Where: V_O3 Measured at I_IN = +30µA
V_O4 Measured at I_IN = –30µA
VOA + RT @ () 30mA) ) VOB
VOB + RT @ (* 30mA) ) VOB
Procedure 3
V_OMAX = V_O7 – V_O8
Where: V_O7 Measured at I_IN = +65µA
V_O8 Measured at I_IN = –65µA
Procedure 4
I_IN Test Pass Conditions:
V_O7 – V_O5 > 20mV and V₀₆ – V_O5 > 50mV
Where: V_O5 Measured at I_IN = +40µA
V_O6 Measured at I_IN = –400µA
V_O7 Measured at I_IN = +65µA
V_O8 Measured at I_IN = –65µA
Test Circuit 8
Figure 6. Test Circuit 8
SD00331
9