SA5211 Datasheet, PDF (4/20 Pages) NXP Semiconductors – Transimpedance amplifier 180MHz

Philips Semiconductors
Transimpedance amplifier (180MHz)
Product specification
SA5211
AC ELECTRICAL CHARACTERISTICS
Typical data and Min and Max limits apply at V_CC=5V and T_A=25°C
SYMBOL
PARAMETER
TEST CONDITIONS
Min Typ Max
UNIT
R_T
Transresistance (differential output)
DC tested R_L = ∞
Test Circuit 8, Procedure 1
21
28
36
kΩ
R_O
Output resistance (differential output)
R_T
Transresistance (single-ended output)
R_O
Output resistance (single-ended output)
f_3dB
Bandwidth (-3dB)
DC tested
DC tested
R_L = ∞
DC tested
T_A = 25°C
Test circuit 1
30
10.5
14
18.0
15
180
Ω
kΩ
Ω
MHz
R_IN
C_IN
∆R/∆V
∆R/∆T
I_N
I_T
Input resistance
Input capacitance
Transresistance power supply sensitivity
Transresistance ambient temperature sensitivity
RMS noise current spectral density (referred to
input)
Integrated RMS noise current over the bandwidth
(referred to input)
V_CC = 5±0.5V
∆T_A = T_{A MAX}-T_{A MIN}
Test Circuit 2
f = 10MHz
T_A = 25°C
T_A = 25°C
Test Circuit 2
200
4
3.7
0.025
1.8
Ω
pF
%/V
%/°C
pA/√Hz
C_S=0¹
∆f = 50MHz
∆f = 100MHz
∆f = 200MHz
13
20
nA
35
∆f = 50MHz
13
C_S=1pF
∆f = 100MHz
∆f = 200MHz
21
nA
41
PSRR
Power supply rejection ratio²
(V_CC1 = V_CC2)
DC tested, ∆V_CC = 0.1V
Equivalent AC
23
32
dB
Test Circuit 3
PSRR
Power supply rejection ratio² (V_CC1)
DC tested, ∆V_CC = 0.1V
Equivalent AC
23
32
dB
Test Circuit 4
PSRR
Power supply rejection ratio² (V_CC2)
DC tested, ∆V_CC = 0.1V
Equivalent AC
45
65
dB
Test Circuit 5
PSRR
Power supply rejection ratio (ECL configuration)²
f = 0.1MHz
Test Circuit 6
23
dB
V_OMAX
Maximum differential output voltage swing
R_L = ∞
Test Circuit 8, Procedure 3
1.7
3.2
V_P-P
Maximum input amplitude for output duty cycle of
V_{IN MAX}
50±5%³
Test Circuit 7
160
mV_P-P
t_R
Rise time for 50mV output signal⁴
Test Circuit 7
0.8
1.8
ns
NOTES:
1. Package parasitic capacitance amounts to about 0.2pF
2. PSRR is output referenced and is circuit board layout dependent at higher frequencies. For best performance use RF filter in V_CC lines.
3. Guaranteed by linearity and overload tests.
4. t_R defined as 20-80% rise time. It is guaranteed by -3dB bandwidth test.
1998 Oct 07
4