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| 74HC_HCT2G125_15 Datasheet, PDF (8/15 Pages) NXP Semiconductors – Dual buffer/line driver; 3-state | |||
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NXP Semiconductors
74HC2G125; 74HCT2G125
Dual buffer/line driver; 3-state
9,
W:
QHJDWLYH
SXOVH
90
9
WI
9,
SRVLWLYH
SXOVH
WU
90
9
W:
90
WU
WI
90
9,
*
9&&
92
'87
57
9&&
5/ 6
&/
RSHQ
DDG
Fig 8.
Test data is given in Table 10.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
VI
74HC2G125
VCC
74HCT2G125
3V
tr, tf
ï£ 6 ns
ï£ 6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 kï
1 kï
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74HC_HCT2G125
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 â 17 March 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
8 of 15
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