74F524 Datasheet, PDF (7/14 Pages) NXP Semiconductors – 8-bit register comparator open-collector 3-State

Philips Semiconductors
8-bit register comparator (open collector + 3-State)
Product specification
74F524
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN TYP² MAX
UNIT
I_OH
High-level output current
LT, EQ, GT
only
V_CC = MIN, V_IL = MAX,
V_IH = MIN, V_OH = MAX
250
µA
C/SO only
V_CC = MIN,
±10%V_CC 2.5
V
V_OH
High-level output voltage
V_IL = MAX, I_OH=MAX ±10%V_CC 2.4
V
I/On only
V_IH = MIN
±5%V_CC
2.7
3.4
V
V_OL
Low-level output voltage
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OL = MAX
±10%V_CC
±5%V_CC
0.35 0.50
V
0.35 0.50
V
V_IK
I_I
I_IH
I_IL
I_OZH
I_OZL
Input clamp voltage
Input current at maximum ^I/On
input voltage
Except I/On
High-level input current
Low-level input current
Except I/On
Off-state output current
High-level voltage applied
Off-state output current
Low-level voltage applied
I/On only
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 5.5V
V_CC = MAX, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_O = 2.7V
V_CC = MAX, V_O = 0.5V
–0.73 –1.2
V
1
mA
100
µA
20
µA
–0.6
mA
70
µA
–0.6
mA
I_OS
Short-circuit output
current³
Except LT,
EQ, GT
V_CC = MAX
–60
–150
mA
I_CC
Supply current (total)
V_CC = MAX
110
150
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1990 Aug 07
7