74HC1G08 Datasheet, PDF (6/16 Pages) NXP Semiconductors – 2-input AND gate

Philips Semiconductors
2-input AND gate
Product specification
74HC1G08; 74HCT1G08
Family 74HCT1G
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
SYMBOL PARAMETER
TEST CONDITIONS
OTHER
V_CC (V)
V_IH
V_IL
V_OH
V_OL
I_LI
I_CC
∆I_CC
HIGH-level input
voltage
LOW-level input
voltage
HIGH-level output
voltage
V_I = V_IH or V_IL;
I_O = −20 µA
V_I = V_IH or V_IL;
I_O = −2.0 mA
LOW-level output
voltage
V_I = V_IH or V_IL;
I_O = 20 µA
V_I = V_IH or V_IL;
I_O = 2.0 mA
input leakage current V_I = V_CC or GND
quiescent supply
current
additional supply
current per input
V_I = V_CC or GND;
I_O = 0
V_I = V_CC − 2.1 V;
I_O = 0
4.5 to 5.5
4.5 to 5.5
4.5
4.5
4.5
4.5
5.5
5.5
4.5 to 5.5
T_amb (°C)
−40 to +85
−40 to +125
MIN. TYP.⁽¹⁾ MAX. MIN. MAX.
2.0
1.6
−
2.0
−
−
1.2
0.8
−
0.8
4.4
4.5
−
4.4
−
4.13 4.32 −
3.7
−
−
0
0.1
−
0.1
−
0.15 0.33 −
0.4
−
−
1.0
−
1.0
−
−
10
−
20
−
−
500 −
850
UNIT
V
V
V
V
V
V
µA
µA
µA
Note
1. All typical values are measured at T_amb = 25 °C.
2002 May 17
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