74F842 Datasheet, PDF (6/12 Pages) NXP Semiconductors – Bus interface latches

Philips Semiconductors
10-bit bus interface latches, non-inverting/inverting
(3-State)
Product data
74F841/74F842
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
HIGH-level output voltage
V_OL
LOW-level output voltage
± 10%V_CC 2.2
–
–
V
V_CC = MIN;
I_OH = –15 mA _{± 5%VCC}
2.2
3.3
–
V
V_IL = MAX;
V_IH = MIN
± 10%V_CC 2.0
–
–
V
I_OH = –24 mA
± 5%V_CC
2.0
–
–
V
V_CC = MIN; I_OL = 32 mA ± 10%V_CC
–
0.38 0.55
V
V_IL = MAX;
V_IH = MIN
I_OL = 48 mA ± 5%V_CC
–
0.38 0.55
V
V_IK
I_I
I_IH
I_IL
I_OZH
Input clamp voltage
Input current at maximum input voltage
HIGH-level input current
LOW-level input current
Off-state output current,
HIGH-level voltage applied
V_CC = MIN; I_I = I_IK
V_CC = 0 V; V_I = 7.0 V
V_CC = MAX; V_I = 2.7 V
V_CC = MAX; V_I = 0.5 V
V_CC = MAX; V_O = 2.7 V
–
–0.73 –1.2
V
–
–
100
µA
–
–
20
µA
–
–
–20
µA
–
–
50
µA
I_OZL
Off-state output current,
LOW-level voltage applied
V_CC = MAX; V_O = 0.5 V
–
–
–50
µA
I_OS
Short-circuit output current³
V_CC = MAX
–100
–
–225
mA
I_CCH
–
50
65
mA
74F841 I_CCL
V_CC = MAX
–
60
80
mA
I_CC
Supply current
(total)
I_CCZ
I_CCH
–
70
92
mA
–
40
60
mA
74F842 I_CCL
V_CC = MAX
–
65
90
mA
I_CCZ
–
60
90
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5 V, T_amb = 25 °C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.
In any sequence of parameter test, I_OS tests should be performed last.
2004 Jan 23
6