SA5217 Datasheet, PDF (5/12 Pages) NXP Semiconductors – Postamplifier with link status indicator

Philips Semiconductors
Postamplifier with link status indicator
Product specification
SA5217
AC ELECTRICAL CHARACTERISTICS
Min and Max limits apply over the operating temperature range at V_CCA = V_CCD = +5.0V unless otherwise specified. Typical data applies at
V_CCA = V_CCD = +5.0V and T_A = 25°C.
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
Min Typ Max
UNIT
f_OP
V_INH
Maximum operating frequency
Maximum Functional A1 input signal (single en-
ded)
Test circuit
Test Circuit
60
75
1.6
MHz
V_P-P
Minimum Functional A1 input signal (single-en-
ded)
Minimum Functional A1 input signal (differential)
V_INL
Minimum input sensitivity for output BER ≤ 10^–9
(single-ended)
Minimum input sensitivity for output BER ≤ 10^–9
(differential)
Test CIrcuit
PRBS = 2²³â€“1
6
mV_P-P
3
9
mV_P-P
4.5
R_IN1
C_IN1
R_IN8
C_IN2
R_OUT2
C_OUT2
V_HYS
Input resistance (differential at IN₁)
Input capacitance (differential at IN₁)
Input resistance (differential at IN₂)
Input capacitance (differential at IN₂)
Output resistance (differential at OUT₂)
Output capacitance (differential at OUT₂)
Hysteresis voltage range (single-ended)
Hysteresis voltage range (differential)
PRBS = 2²³â€“1
Test circuit, T_A = 25°C
R_RHYST=5k R_THRESH=33k
1200
2
2000
2
25
2
10
5
Ω
pF
Ω
pF
Ω
pF
mV_P-P
V_THR
t_TLH
t_THL
t_RFD
t_PWD
Threshold voltage (single-ended)
Threshold voltage (differential)
TTL Output Rise Time 20% to 80%
TTL Output Fall Time 80% to 20%
t_TLH/t_THL mismatch
Pulse width distortion of output
(FLAG Low) Test circuit,
@ 50MHz
R_RHYST=4k R_THRESH=33k
Test Circuit
Test Circuit
50mV_P-P, 1010. . .input
Distortion =
T_H
T_H
*
)
T_L
T_L
10²
19
9.5
1.3
1.2
0.1
TBD
mV_P-P
ns
ns
ns
%
V_CC
+5V
NE5217
100µH
125
33k ^0.1µF
0.1µF
1
2
3
4
5
6
7
LED
IN_1B
C_PKDET IN_1A
THRESH C_AZP
20
19
18
17
GND_A
FLAG
JAM
C_AZN
OUT_2B
IN_8B
16
15
14
0.1µF
0.1µF
0.1µF
25
V_IN
50
8 ^{VCCD OUT2A} 13 ^0.1µF
100µH
9 ^VCCA
IN_{8A 12 4k}
0.1µF
10 ^{GNDD RHYST} 11
V_OUT R_PKDET
10k
10µF
400
V_OUT
15pF
1998 Oct 07
Figure 3. AC Test Circuit
5
SD00356