74HC1G32 Datasheet, PDF (5/16 Pages) NXP Semiconductors – 2-input OR gate

Philips Semiconductors
2-input OR gate
Product specification
74HC1G32; 74HCT1G32
DC CHARACTERISTICS
Family 74HC1G
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
TEST CONDITIONS
SYMBOL
PARAMETER
OTHER
V_CC
(V)
V_IH
HIGH-level input voltage
2.0
4.5
6.0
V_IL
LOW-level input voltage
2.0
4.5
6.0
V_OH
HIGH-level output
voltage
V_I = V_IH or V_IL;
2.0
I_O = −20 µA
V_I = V_IH or V_IL;
4.5
I_O = −20 µA
V_I = V_IH or V_IL;
6.0
I_O = −20 µA
V_I = V_IH or V_IL;
4.5
I_O = −2.0 mA
V_I = V_IH or V_IL;
6.0
I_O = −2.6 mA
V_OL
LOW-level output voltage V_I = V_IH or V_IL;
2.0
I_O = 20 µA
V_I = V_IH or V_IL;
4.5
I_O = 20 µA
V_I = V_IH or V_IL;
6.0
I_O = 20 µA
V_I = V_IH or V_IL;
4.5
I_O = 2.0 mA
V_I = V_IH or V_IL;
6.0
I_O = 2.6 mA
I_Ll
input leakage current
V_I = V_CC or GND 6.0
I_CC
quiescent supply current V_I = V_CC or GND; 6.0
I_O = 0
T_amb (°C)
−40 to +85
−40 to +125 UNIT
MIN. TYP.⁽¹⁾ MAX. MIN. MAX.
1.5 1.2
3.15 2.4
4.2 3.2
−
0.8
−
2.1
−
2.8
1.9 2.0
−
1.5 −
V
−
3.15 −
V
−
4.2 −
V
0.5 −
0.5 V
1.35 −
1.35 V
1.8 −
1.8 V
−
1.9 −
V
4.4 4.5 −
4.4 −
V
5.9 6.0 −
5.9 −
V
4.13 4.32 −
3.7 −
V
5.63 5.81 −
5.2 −
V
−
0
0.1 −
0.1 V
−
0
0.1 −
0.1 V
−
0
0.1 −
0.1 V
−
0.15 0.33 −
0.4 V
−
0.16 0.33 −
0.4 V
−
−
1.0 −
1.0 µA
−
−
10
−
20
µA
Note
1. All typical values are measured at T_amb = 25 °C.
2002 May 15
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