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IRF840 Datasheet, PDF (3/7 Pages) Motorola, Inc – N-CHANNEL ENHANCEMENT-MODE SILICON GATE TMOS POWER FIELD EFFECT TRANSISTOR
Philips Semiconductors
PowerMOS transistor
Avalanche energy rated
120 PD%
Normalised Power Derating
110
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tmb)
ID%
120
Normalised Current Derating
110
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140
Tmb / C
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 10 V
ID / A
100
10
RDS(ON) = VDS/ID
1
DC
BUK457-500B
tp = 10 us
100 us
1 ms
10 ms
100 ms
0.1
1
10
100
1000
VDS / V
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
Product specification
IRF840
1 Zth j-mb, Transient thermal impedance (K/W) PHP6N60
D = 0.5
0.2
0.1 0.1
0.05
0.02
0.01
single pulse
PD
tp
D = tp
T
T
t
0.0011us
10us 100us 1ms
10ms 100ms
1s
tp, pulse width (s)
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
30 ID, Drain current (Amps)
Tj = 25 C
25
20
15
10
5
PHP8N50
10 V
7V
6.5 V
6V
5.5 V
5V
VGS = 4.5 V
0
0
5
10
15
20
25
30
VDS, Drain-Source voltage (Volts)
Fig.5. Typical output characteristics.
ID = f(VDS); parameter VGS
2 RDS(on), Drain-Source on resistance (Ohms) PHP8N50
4.5 V
5V
5.5 V VGS = 6 V Tj = 25 C
1.5
6.5 V
7V
1
10 V
0.5
0
0
5
10
15
20
25
ID, Drain current (Amps)
Fig.6. Typical on-state resistance.
RDS(ON) = f(ID); parameter VGS
March 1999
3
Rev 1.000