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| 74HC_HCT595_15 Datasheet, PDF (15/24 Pages) NXP Semiconductors – 8-bit serial-in, serial or parallel-out shift register with output latches; 3-state | |||
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NXP Semiconductors
74HC595; 74HCT595
8-bit serial-in, serial or parallel-out shift register with output latches; 3-state
9,
W:
QHJDWLYH
SXOVH
90
9
WI
9,
SRVLWLYH
SXOVH
WU
90
9
W:
90
WU
WI
90
9,
*
9&&
92
'87
57
9&&
5/ 6
&/
RSHQ
DDG
Test data is given in Table 9.
Definitions for test circuit:
CL = load capacitance including jig and probe capacitance.
RL = load resistance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
S1 = test selection switch.
Fig 14. Test circuit for measuring switching times
Table 9. Test data
Type
Input
74HC595
74HCT595
VI
tr, tf
VCC
6 ns
3V
6 ns
Load
CL
50 pF
50 pF
RL
1 kï
1 kï
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74HC_HCT595
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 â 26 January 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
15 of 24
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