PDIUSBD11 Datasheet, PDF (12/20 Pages) NXP Semiconductors – USB device with serial interface

Philips Semiconductors
USB device with serial interface
Product specification
PDIUSBD11
DC CHARACTERISTICS (AI/O pins)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
Leakage Current
I_LO
Hi-Z state data line leakage
0V < V_IN < 3.3V
Input Levels
V_DI
Differential input sensitivity
|(D+) – (D–)|¹
0.2
V_CM
Differential common mode range
Includes V_DI range
0.8
V_SE
Single-ended receiver threshold
0.8
Output Levels
V_OL
Static output LOW
V_OH
Static output HIGH
Capacitance
R_L of 1.5kW to 3.6V
R_L of 15kW to GND
2.8
C_IN
Transceiver capacitance
Pin to GND
Output Resistance
Z_DRV² Driver output resistance
Steady state drive
29
Integrated Resistance
Z_PU
Pull-up resistance
SoftConnect™ = ON
1.1
Z_PD
Pull-down resistance
Pull-down = ON
11
NOTES:
1. D+ is the symbol for the USB positive data pin: DP.
D– is the symbol for the USB negative data pin: DM.
2. Includes external resistors of 22 W ± 1% each on D+ and D–.
LOAD FOR D+/D–
UPSTREAM: 1.5kW IS INTERNAL
D. U. T.
TEST POINT
22W
15kW
S1
C_L
V_CC
1.5kW*
MAX
UNIT
±10
µA
V
2.5
V
2.0
V
0.3
V
3.6
V
20
pF
44
W
1.9
kW
19
kW
C_L = 50pF, FULL SPEED
C_L = 50PF, LOW SPEED (MIN TIMING)
C_L = 350PF, LOW SPEED (MAX TIMING)
* 1.5kW ON D– (LOW SPEED) OR D+ (FULL SPEED) ONLY
TEST S1
D–/LS
D+/LS
D–/FS
D+/FS
CLOSE
OPEN
OPEN
CLOSE
SV00836
1999 Jul 22
12