EEV-FK1V222M Datasheet, PDF (12/21 Pages) Panasonic Semiconductor – DIGI-KEY CORPORATION

Engineering Draft
V-FK-E-514
10
No
Item
13 Endurance
14 Shelf Life
Performance characteristics
Test
Leakage Current :
≦the value of item 7.1.
Capacitance change :
Test Tem perature : 105℃±2℃
Test Duration : 5000⁺⁷²⁰ hours
Applied Voltage : Rated voltage
Within ±30% of initial measured value.
Tangent of Loss Aangle (tanδ):
After subjected to the test, the capacitors shall
≦200% of the value of item 7.3.
be left at room temperature and room humidity
Appearance :
for 2 hours prior to the measurement.
No significant change can be observed.
Leakage Current :
≦the value of item 7.1.
Capacitance Change :
Test Tem perature : 105℃±2 ℃
Test Duration : 1000⁺⁴⁸⁰ hours
Within ±30% of initial measured value.
Tangent of Loss Angle (tanδ) :
After subjected to the test, D.C. rated
≦200% of the value of item 7.3.
voltage shall be applied to the capacitors for
Appearance :
30 m inutes as post-test treatment after left
No significant change can be observed. at the room tem perature and humidity for 2
hours prior to the measurement.
* Voltage treatment : The rated voltage shall be applied to the capacitors, which are connected to series protective
resistors (1000Ω±10Ω), for 30 minutes as a posttest treatment (performing discharge).
8．Other Characteristics
■Table 1. Characteristics at low temperature Impedance ratio (at 120Hz)
R.V.(V D.C.)
35
Z(-25℃)/Z(20℃) 2
Z(-40℃)/Z(20℃) 3
Z(-55℃)/Z(20℃) 3
■Table 2. Frequency Correction Factor of Rated Ripple Current
50,60
Coefficient 0.70
Frequency　(Hz)
120
1k
10k
0.75
0.90
0.95
100k～
1.00
Panasonic Corporation