CAT5409_13 Datasheet, PDF (6/15 Pages) ON Semiconductor – Quad Digital Potentiometer (POT)

CAT5409
Table 10. RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
N_END (Note 10)
Endurance
MIL−STD−883, Test Method 1033
1,000,000
T_DR (Note 10)
Data Retention
MIL−STD−883, Test Method 1008
100
V_ZAP (Note 10)
ESD Susceptibility
MIL−STD−883, Test Method 3015
2000
I_LTH (Notes 10, 11)
Latch-up
JEDEC Standard 17
100
10. This parameter is tested initially and after a design or process change that affects the parameter.
11. t_PUR and t_PUW are delays required from the time V_CC is stable until the specified operation can be initiated.
Units
Cycles/Byte
Years
V
mA
t_F
SCL
t_SU:STA
SDA IN
SDA OUT
t_HIGH
t_R
t_LOW
t_LOW
t_HD:STA
t_HD:DAT
t_SU:DAT
t_AA
t_DH
t_SU:STO
t_BUF
Figure 2. Bus Timing
SCL
SDA
8TH BIT
BYTE n
ACK
t_WR
STOP
CONDITION
Figure 3. Write Cycle Timing
START
CONDITION
ADDRESS
SDA
SCL
START CONDITION
STOP CONDITION
Figure 4. Start/Stop Timing
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