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74HC574 Datasheet, PDF (6/8 Pages) NXP Semiconductors – Octal D-type flip-flop; positive edge-trigger; 3-state
◁
tr
tf
CLOCK
90%
50%
10%
tw
90%
Q 50%
10%
1/fmax
tPLH
tPHL
tTLH
tTHL
Figure 3.
74HC574
SWITCHING WAVEFORMS
VCC
GND
1.3 V
tPZL tPLZ
Q
1.3 V
tPZH tPHZ
Q
3.0 V
GND
HIGH
IMPEDANCE
10% VOL
90% VOH
HIGH
IMPEDANCE
Figure 4.
DATA
CLOCK
VALID
50%
tsu
th
50%
Figure 5.
VCC
GND
VCC
GND
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
*Includes all probe and jig capacitance.
Figure 6.
D0 2
D1 3
D2 4
DEVICE
UNDER
TEST
TEST POINT
OUTPUT 1 kW
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance.
Figure 7. Test Circuit
D3 5
D4 6
D5 7
D6 8
D7 9
CLOCK 11
OUTPUT ENABLE 1
C
Q
D
C
Q
D
C
Q
D
CQ
D
C
Q
D
CQ
D
C
Q
D
C
Q
D
19 Q0
18 Q1
17 Q2
16 Q3
15 Q4
14 Q5
13 Q6
12 Q7
Figure 8. Expanded Logic Diagram
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