English
Language : 

MC74LVX541_11 Datasheet, PDF (5/7 Pages) ON Semiconductor – Octal Bus Buffer
DEVICE
UNDER
TEST
TEST
POINT
OUTPUT
CL*
*Includes all probe and jig capacitance
Figure 6.
MC74LVX541
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST
POINT
OUTPUT
1 kW
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 7.
INPUT
Figure 8. INPUT EQUIVALENT CIRCUIT
ORDERING INFORMATION
Device
Package
Shipping†
MC74LVX541DWG
SOIC−20
(Pb−Free)
38 Units / Rail
MC74LVX541DTR2G
TSSOP−20*
(Pb−Free)
2500 Tape & Reel
MC74LVX541MG
SOEIAJ−20
(Pb−Free)
40 Units / Rail
MC74LVX541MELG
SOEIAJ−20
(Pb−Free)
2000 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
http://onsemi.com
5